Eom J. S. auteur aut IRD Luo D. P. auteur aut IRD Atienza-Grande G. auteur aut IRD Yang J. auteur aut IRD Ji C. H. auteur aut IRD Luu V. T. auteur aut IRD Huguet-Tapia J. C. auteur aut IRD Char S. N. auteur aut IRD Liu B. auteur aut IRD Nguyen H. auteur aut IRD Schmidt S. M. auteur aut IRD Szurek Boris auteur aut IRD Cruz C. V. auteur aut IRD White F. F. auteur aut IRD Oliva R. auteur aut IRD Yang B. auteur aut IRD Frommer W. B. auteur aut IRD text journalArticle eng text/pdf reformatted digital access Blight-resistant rice lines are the most effective solution for bacterial blight, caused by Xanthomonas oryzae pv. oryzae (Xoo). Key resistance mechanisms involve SWEET genes as susceptibility factors. Bacterial transcription activator-like (TAL) effectors bind to effector-binding elements (EBEs) in SWEET gene promoters and induce SWEET genes. EBE variants that cannot be recognized by TAL effectors abrogate induction, causing resistance. Here we describe a diagnostic kit to enable analysis of bacterial blight in the field and identification of suitable resistant lines. Specifically, we include a SWEET promoter database, RT-PCR primers for detecting SWEET induction, engineered reporter rice lines to visualize SWEET protein accumulation and knock-out rice lines to identify virulence mechanisms in bacterial isolates. We also developed CRISPR-Cas9 genome-edited Kitaake rice to evaluate the efficacy of EBE mutations in resistance, software to predict the optimal resistance gene set for a specific geographic region, and two resistant 'mega' rice lines that will empower farmers to plant lines that are most likely to resist rice blight. specialized 076 084 37 11 1372-1379 + 1 p. 2019 1087-0156 https://www.documentation.ird.fr/hor/fdi:010077321 10.1038/s41587-019-0268-y 1087-0156 [F B010077321] https://www.documentation.ird.fr/hor/fdi:010077321 https://horizon.documentation.ird.fr/exl-doc/pleins_textes/divers19-11/010077321.pdf IRD - Base Horizon / Pleins textes 2019-12-12 2019-12-16 fdi:010077321 fre